JPH044284U - - Google Patents

Info

Publication number
JPH044284U
JPH044284U JP4467990U JP4467990U JPH044284U JP H044284 U JPH044284 U JP H044284U JP 4467990 U JP4467990 U JP 4467990U JP 4467990 U JP4467990 U JP 4467990U JP H044284 U JPH044284 U JP H044284U
Authority
JP
Japan
Prior art keywords
inspection
circuit pattern
probing
inspected
circuit board
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4467990U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP4467990U priority Critical patent/JPH044284U/ja
Publication of JPH044284U publication Critical patent/JPH044284U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP4467990U 1990-04-27 1990-04-27 Pending JPH044284U (en])

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4467990U JPH044284U (en]) 1990-04-27 1990-04-27

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4467990U JPH044284U (en]) 1990-04-27 1990-04-27

Publications (1)

Publication Number Publication Date
JPH044284U true JPH044284U (en]) 1992-01-16

Family

ID=31558200

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4467990U Pending JPH044284U (en]) 1990-04-27 1990-04-27

Country Status (1)

Country Link
JP (1) JPH044284U (en])

Similar Documents

Publication Publication Date Title
ATE180065T1 (de) Fabrikationsfehleranalysator mit verbesserter fehlererfassung
JPH044284U (en])
EP0846953A3 (en) Printed circuit board inspecting apparatus, and method of using a universal-type printed circuit board inspecting apparatus
JP2523483B2 (ja) プロ―ブポイント決定装置
JPH0541567A (ja) プリント配線板
JP2000146857A5 (ja) パターン欠陥検査方法及びその装置並びにフォトマスクの検査方法
JPH03227100A (ja) 印刷配線板の布線試験データ処理装置
JPS6078362A (ja) 自動試験装置の機能チエツク方式
JPS6126243A (ja) Lsiア−トワ−クデ−タの回路接続照合出力装置
JPH0714926Y2 (ja) 半導体試験装置の波形入出力装置
JP2003307543A (ja) Lsi検査装置及び検査手法
JP2964523B2 (ja) インサーキットテスト装置
JPS63188579U (en])
JPS5834063U (ja) インサ−キツトテスタ用万能接続治具
JPH04259863A (ja) 回路パターンの判定方式
JPH025083U (en])
JPH0348181A (ja) プリント基板の分割導通検査方法
JPH0458197B2 (en])
JPS63201575A (ja) プリント基板搭載回路試験方法
JPH0261717B2 (en])
JPS586538U (ja) 静止形継電器の点検装置
JPH02129572A (ja) ボードテスタ
JPH01287449A (ja) パターン欠陥検査装置
JPS62155376U (en])
JPH01155681A (ja) 印刷配線基板装置